Ceramic vessel 0105. Cerro de la Compañía

Funerary urn located in the Iberian hypogeum Cerro de la Compañía (Hornos de Peal, Jaén, Spain). Oxidising atmosphere. It is decorated with a doble coating. The first one with red bands and the second with a white layer decorated with undefined red motifs. The red color is obtained with hematite (Fe2O3). The white layer is made of calcite (CaCO3).

Condition: New product

Dimensions

Ancho : 30 Centimeters

Alto : 35 Centimeters

Materials

pottery

Temporal

Period name : Iberians, Iberian

Date : Late 6th ct. BC

Spatial

Location : Hipogeo Cerro de la Compañía

Geopolitical area : Hornos de Peal, Jaén, Spain

Spatial reference system : WGS84

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

References

Book - Molinos, M. y Ruiz, A. (2007): El hipogeo ibero del Cerrillo de la Compañía de Hornos (Peal de Becerro, Jaén). Junta de Andalucía, Universidad de Jaén. Jaén.

Resource available online - Cámara ibérica del Cerro de La Compañía (Hornos de Peal, Jaén).

Digital Resources

Photo funerary urn 0105. Cerro de la Compañía

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Aerial photo of hypogeum Cerro de la Compañía

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Raman spectrum of thered decoration. Recipiente 0105.

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Raman spectrum of the white coating. Recipiente 0105.

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/

Activities

Archaeometric analysis

Physical-chemical analysis

Ceramic. Analysis of decoration

University Research Center for Iberian Archaeology

Raman Microscopy

Mineral analysis of the red and black decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Micro-Raman Spectroscopy (MRS);

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon.