New product
: 0.75 Centimeters
: 0.75 Centimeters
Floor
: Iberians, Iberian
: 5th ct. BC
: Oppidum de Puente Tablas
: Puente Tablas, Jaén, Spain
: WGS84
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Ruiz A. y M. Molinos (coord.) (2015): Jaén, tierra ibera. 40 años de investigación y transferencia. Universidad de Jaén.
Sánchez, A.; Parras, D.; Montejo, M. y Ramos, N. (2007): “Análisis físico-químicos en las casas 6 y 7 del asentamiento ibérico de Puente Tablas, Jaén”. VII Congreso Ibérico de Arqueometría. CSIC. Madrid. 601-610.
Sánchez, A.; Parras, D. J.; Tuñón, J. A.; Rísquez, C. Rodríguez, Mª O.; Montejo, M.; Ramos, N.; García-Reyes, J. F. y Márquez, F. (2014): Physical–chemical analysis for the research and the valorisation of the oppidum of Puente Tablas (Jaén, Spain). Science, Technology and Cultural Heritage. CRC Press/Balkema. Taylor %26 Francis Group, London. 103-108.
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Archaeometric analysis Physical-chemical analysis Floor. Composition
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Raman Microscopy Mineral analysis of the red decoration Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement. Micro-Raman Spectroscopy (MRS) Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon. |