Ceramic vessel 113-1. Oppidum Puente Tablas

Ceramic vessel of the sanctuary of the Iberian oppidum of Puente Tablas (Jaén, Spain). Oxidising atmosphere. Decoration with black lines. The black color is manufactured using a oxide of manganese identified by MRS as bixbyite/hausmannite (Mn2O3/Mn3O4) and jacobsite (MnFe2O4). Bixbyite/hausmannite are the result of the transformation of pyrolusite when firing temperature is set above 450ºC and below 900ºC. The presence of jacobsite means a temperature reaching the 900ºC.
Analysis by EDXRF of the black color confirms the presence of Mn: 0.73% wt of Mn versus 0.07% wt in the ceramic paste.
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Dimensions

: 5 Centimeters

: 6 Centimeters

Materials

pottery

Temporal

: Iberians, Iberian

: Early 4th ct. BC

Otros metadatos

Spatial

  • : Oppidum de Puente Tablas
  • : Puente Tablas, Jaén, Spain
  • : WGS84
 

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

References

Ruiz A. y M. Molinos (coord.) (2015): Jaén, tierra ibera. 40 años de investigación y transferencia. Universidad de Jaén.

Parras, D.; Vandenabeele, P.; Sánchez, A.; Montejo, M.; Moens, L. y Ramos, N. (2010): “Micro-Raman spectroscopy of decorated pottery from the Iberian archaeological site of Puente Tablas (Jaén, Spain, VII-IV century b.C.)”. Journal of Raman Spectroscopy, 41: 68-73.

Tuñón, J.A., Sánchez, A., Parras, D.J., Vandenabeele, P. and Montejo, M. (2016): “Micro-Raman spectroscopy on Iberian archaeological material”. Journal of Raman Spectroscopy. 47: 1514-1521.

Digital Resources

Activities

  • Archaeometric analysis
  • Physical-chemical analysis
  • Ceramic. Analysis of decoration

University Research Center for Iberian Archaeology

Raman Microscopy

Mineral analysis of the black decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Micro-Raman Spectroscopy (MRS)

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon

X-Ray Fluorescence

Elemental analysis of the black decoation

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Energy dispersive X- ray fluorescence (EDXRF);

EDAX (model Eagle III) fluorescence spectrometer (CITI, University of Seville). This spectrometer is equipped with a microfocus X-ray tube with an Rh anode, a polycapillary lens for X-ray focussing, and an 80 mm2 energy dispersive Si-(Li) detector. The sample chamber incorporates an XYZ motorized stage for sample positioning. A high resolution microscope is used to position the sample on the desired distance from the polycapillary. To increase the sensitivity of the low Z elements, the sample chamber can be brought under vacuum. For the analysis of the samples, a spot size of 300 μm was chosen at an operating X-ray tube voltage of 40 kV. The tube current was adapted for each sample in order to optimise the detection of X-rays.;

 

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