Tessera 26. Mosaic of Fuente de la Peñuela (Santisteban del Puerto, Jaén, Spain)

Black tessera belonging to the mosaic of the Roman villa of Fuente de la Peñuela (Santisteban del Puerto, Jaén, Spain). It is located in the scene on the right (Achilles in Scyros). Raman analysis indicates the presence of quartz (SiO2), and X-ray fluorescence shows a high content of Si, and to a lesser extent Ca, Al, and Fe. The raw material used in its manufacture was, therefore, a quartz sandstone.
Leer más Leer menos

New product

Dimensions

: 1 Centimeters

: 1 Centimeters

Materials

Stone

Temporal

: Roman

: 5th century AD

Spatial

  • : Santisteban del Puerto. Fuente de la Peñuela.
  • : Santisteban del Puerto, Jaén, Spain
  • : WGS84
 

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

Digital Resources

  • Tessera 26
    Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
    Arquiberlab
    http://creativecommons.org/licenses/by-nc-nd/3.0/
    [ver más...] [ver menos]
  • Tessera 26 in Achiles in Scyros scene
    Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
    Arquiberlab
    http://creativecommons.org/licenses/by-nc-nd/3.0/
    [ver más...] [ver menos]
  • Mosaic of Fuente de la Peñuela
    Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
    Arquiberlab
    http://creativecommons.org/licenses/by-nc-nd/3.0/
    [ver más...] [ver menos]
  • Tessera 26. Raman analysis IUIAI-UJA
    Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
    Arquiberlab
    http://creativecommons.org/licenses/by-nc-nd/3.0/
    [ver más...] [ver menos]
  • IUIAI-UJA
    Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
    Arquiberlab
    http://creativecommons.org/licenses/by-nc-nd/3.0/
    [ver más...] [ver menos]

Activities

  • Archaeometric analysis

University Research Center for Iberian Archaeology

Raman Microscopy

Mineralogical analysis

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Portable Raman spectrometer (model BWS445-785S innoRam) equipped with a CCD detector, a handheld fiber-optic probe, an automated MicroBeam tripod, a benchtop stand for small samples, and a BAC151A camera (University Research Institute for Iberian Archaeology, University of Jaén). A 785 nm diode laser (300 mW) was used, with a spectral resolution better than 4.5 cm-1

X-Ray Fluorescence

Elemental analysis

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Bruker Tracer III SD handheld XRF spectrometer (HERCULES Laboratory, University of Évora, Portugal). This instrument is equipped with a silicon drift 10 mm 2  SDD detector, and a Rh target delivering a polychromatic X-ray beam of 3×3 mm². Spectra were acquired with 40 kV and a current of 11 μA, for a life time of 30 s. This analytical method detects elements with an atomic number higher than 12.

 

8 other products in the same category:

Menu