Covering 140001. Burial mound 140. Cemetery of Tutugi.

Spectroscopic analysis

Mineral analysis of the white covering and red decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Micro Raman Spectroscopy (MRS)

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon.

X-Ray Difraction

Analysis of the white covering

Method of crystalline powder. The samples were ground to powder in an Agatha mortar until an adequate particle size (0.25 mm) and weighed approximately 1 g.

X-ray diffraction (XRD)

The analyses were carried out in the Scientific Instrument Service of the University of Granada using a diffractometer BRUKER D8 ADVANCE equipped with a copper tube, geometry θθ and with a LYNXEYE Detector. Diffraction data were collected in the range of 2θ Bragg angles from 5º to 80º in 0.02º steps, step time 0.2 s.

X-Ray Fluorescence

Elemental analysis of the red decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Energy dispersive X- ray fluorescence (EDXRF)

EDAX (model Eagle III) fluorescence spectrometer (CITI, University of Seville). This spectrometer is equipped with a microfocus X-ray tube with an Rh anode, a polycapillary lens for X-ray focussing, and an 80 mm2 energy dispersive Si-(Li) detector. The sample chamber incorporates an XYZ motorized stage for sample positioning. A high resolution microscope is used to position the sample on the desired distance from the polycapillary. To increase the sensitivity of the low Z elements, the sample chamber can be brought under vacuum. For the analysis of the samples, a spot size of 300 μm was chosen at an operating X-ray tube voltage of 40 kV. The tube current was adapted for each sample in order to optimise the detection of X-rays.