Ceramic vessel 494-2. Oppidum Puente Tablas

Ceramic vessel type Real from the Gate of the Sun of the Iberian oppidum of Puente Tablas (Jaén, Spain). Reducing atmosphere. Post-firing decoration with inner and outer red lines on a back blackgroung. The red color is manufactured with hematites (Fe2O3) in high concentration (41.70% of Fe according to the analysis by EDXRF). The black background is made with amorphous carbon. Amorphous carbon experiments with the increase of the temperature serious modifications. This indicates therefore that its application is after the firing.

New product

Dimensions

: 2 Centimeters

: 1.7 Centimeters

Materials

pottery

Temporal

: Orientalising, Late Bronze

: 8th-7th ct. BC

Spatial

: Oppidum de Puente Tablas

: Puente Tablas, Jaén, Spain

: WGS84

 

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

References

Ruiz A. y M. Molinos (coord.) (2015): Jaén, tierra ibera. 40 años de investigación y transferencia. Universidad de Jaén.

Parras, D.; Vandenabeele, P.; Sánchez, A.; Montejo, M.; Moens, L. y Ramos, N. (2010): “Micro-Raman spectroscopy of decorated pottery from the Iberian archaeological site of Puente Tablas (Jaén, Spain, VII-IV century b.C.)”. Journal of Raman Spectroscopy, 41: 68-73.

Tuñón, J.A., Sánchez, A., Parras, D.J., Vandenabeele, P. and Montejo, M. (2016): “Micro-Raman spectroscopy on Iberian archaeological material”. Journal of Raman Spectroscopy. 47: 1514-1521.

Digital Resources

Activities

Archaeometric analysis

Physical-chemical analysis

Ceramic. Analysis of decoration

University Research Center for Iberian Archaeology

Raman Microscopy

Mineral analysis of the red and black decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Micro-Raman Spectroscopy (MRS)

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon.

Spectroscopic analysis

Elemental analysis of the red and black decoration

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Energy dispersive X- ray fluorescence (EDXRF);

EDAX (model Eagle III) fluorescence spectrometer (CITI, University of Seville). This spectrometer is equipped with a microfocus X-ray tube with an Rh anode, a polycapillary lens for X-ray focussing, and an 80 mm2 energy dispersive Si-(Li) detector. The sample chamber incorporates an XYZ motorized stage for sample positioning. A high resolution microscope is used to position the sample on the desired distance from the polycapillary. To increase the sensitivity of the low Z elements, the sample chamber can be brought under vacuum. For the analysis of the samples, a spot size of 300 μm was chosen at an operating X-ray tube voltage of 40 kV. The tube current was adapted for each sample in order to optimise the detection of X-rays.

 

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