Covering. Oppidum Puente Tablas

White covering in the room E, building B, of the palatial complex of the Iberian oppidum of Puente tablas (Jaén, Spain). It is located on the red floor, likely as a consequence of the collapse of the walls, and is manufactured using gypsum (CaSO4·2H2O). The MRS and XRD analyses also show residual calcite (CaCO3).

Condition: New product

Dimensions

Ancho : 150 Centimeters

Alto : 150 Centimeters

Materials

covering

Temporal

Period name : Iberians, Iberian

Date : 6th ct. BC

Spatial

Location : Oppidum de Puente Tablas

Geopolitical area : Puente Tablas, Jaén, Spain

Spatial reference system : WGS84

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

References

Book - Ruiz A. y M. Molinos (coord.) (2015): Jaén, tierra ibera. 40 años de investigación y transferencia. Universidad de Jaén.

Article - Tuñón, J.A., Sánchez, A., Parras, D.J., Vandenabeele, P. and Montejo, M. (2016): “Micro-Raman spectroscopy on Iberian archaeological material”. Journal of Raman Spectroscopy. 47: 1514-1521. <
http://onlinelibrary.wiley.com/doi/10.1002/jrs.4934/abstract

Digital Resources

White Covering. Oppidum Puente Tablas

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Aerial photo of the oppidum Puente Tablas

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Building B. Palatial complex

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Raman spectrum of the white covering

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XRD of the white covering

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Arquiberlab
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WDXRF of the white covering

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Activities

Archaeometric analysis

Physical-chemical analysis

Covering. Characterization analysis

University Research Center for Iberian Archaeology

Raman Microscopy

Mineral analysis of the white covering

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.

Micro-Raman Spectroscopy (MRS)

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon.

X-Ray Difraction

Mineral analysis mof the white decoration

XRD analysis used the method of crystalline powder. The samples were ground to powder in an Agatha mortar until an adequate particle size (0.25 mm) and weighed approximately 1 g.

X ray diffraction (XRD)

The analyses were carried out in the Scientific Instrument Service of the University of Granada using a diffractometer BRUKER D8 ADVANCE equipped with a copper tube, geometry θθ and with a LYNXEYE Detector. Diffraction data were collected in the range of 2θ Bragg angles from 5º to 80º in 0.02º steps, step time 0.2 s.

X-Ray Fluorescence

Elemental analysos of the white covering

Recommended sample quantity is 0.1 g. The sample is mixed with wax (as binder) and boric acid. This mixture is processed in the form of pellet (10 mm diameter) with the aid of a hand press and placed in an isolated chamber where a vacuum (%3C10 Pa) is made.

Wavelength Dispersive X-ray Fluorescence (WDXRF)

AXIOS Panalytical wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer owned by the Center for Innovation and Technological Research in the University of Seville (CITIUS) (Figure 12). The main features of the device include: Rh anode (4.4 kW maximum power), 3 collimators (150 μm, 300 μm and 700 μm), 6 analyzer crystals (LIF200, LIF 220, PX-10, Ge111, PE002, PX-1) that allow qualitative and quantitative chemical analysis of elements from O to U in a wide range of concentrations (from main components to traces), a flow detector (for Z%3C29 elements) and a scintillation detector (for Z>29 elements).