New product
: 3 Centimeters
: 3 Centimeters
covering
: Iberians, Iberian
: Early 3rd ct. BC.
: Cemetery of Tutugi
: Galera, Granada, Spain
: WGS84
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Rodríguez Ariza, Mª O. (2014): La necrópolis ibérica de Tútugi (2000-2012). CAAItextos. Universidad de Jaén, Jaén.
Sánchez, A.; Parras, D.; Tuñón, J. A. Y Ramos, N. (2014): “Análisis de recubrimientos y pigmentos en la necrópolis ibérica de Tútugi (Galera, Granada)”, Mª O. Rodríguez (ed): La necrópolis ibérica de Tútugi (2000-2012). Universidad de Jaén e Instituto Universitario de Investigación en Arqueología Ibérica, Jaén. 349-368.
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
pdf file
Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND) Arquiberlab http://creativecommons.org/licenses/by-nc-nd/3.0/ |
Archaeometric analysis Physical-chemical analysis Covering. Analysis of decoration.
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X-Ray Fluorescence Elemental analysis of the red decoration. Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement. Energy dispersive X- ray fluorescence (EDXRF). EDAX (model Eagle III) fluorescence spectrometer (CITI, University of Seville). This spectrometer is equipped with a microfocus X-ray tube with an Rh anode, a polycapillary lens for X-ray focussing, and an 80 mm2 energy dispersive Si-(Li) detector. The sample chamber incorporates an XYZ motorized stage for sample positioning. A high resolution microscope is used to position the sample on the desired distance from the polycapillary. To increase the sensitivity of the low Z elements, the sample chamber can be brought under vacuum. For the analysis of the samples, a spot size of 300 µm was chosen at an operating X-ray tube voltage of 40 kV. The tube current was adapted for each sample in order to optimise the detection of X-rays. | |
Spectroscopic analysis Mineral analysis of the white layer. Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement. Micro-Raman Spectroscopy (MRS) Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon. |