Covering 20008. Burial mound 20. Cemetery of Tutugi

White covering 20008, the first phase of the burial mound 20 of the Iberian cemetery of Tutugi (Galera, Granada, Spain). It is located inside the chamber and manufactured with gypsum (CaSO4·2H2O).

Condition: New product

Dimensions

Largo : 3 Centimeters

Ancho : 2 Centimeters

Materials

covering

Temporal

Period name : Iberian, Iberians

Date : Late 5th ct. BC

Spatial

Location : Cemetery of Tutugi

Geopolitical area : Galera, Granada, Spain

Spatial reference system : WGS84

Copyrights

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)

References

Book - Rodríguez Ariza, Mª O. (2014): La necrópolis ibérica de Tútugi (2000-2012). CAAItextos. Universidad de Jaén, Jaén

Digital Resources

Photo of the white covering 20008 Instituto Universitario de Investigación en Arqueología Ibérica

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Photo of the burial mound 20008 Instituto Universitario de Investigación en Arqueología Ibérica

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Raman spectrum of white decoration. Sample 20008 Instituto Universitario de Investigación en Arqueología Ibérica

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/
Draw and phases of the burial mound 20

Creative Commons - Attribution, Non-Commercial, No Derivatives (BY-NC-ND)
Arquiberlab
http://creativecommons.org/licenses/by-nc-nd/3.0/

Activities

Arqueometric analysis

Análisis fisico-químico

Covering

University Research Center for Iberian Archaeology

Spectroscopic analysis

Mineral analysis of the white covering

Non destructive. Surface cleaning. Sample pretreatment is not required. Direct measurement.;

Micro-Raman Spectroscopy (MRS)

Renishaw ‘in via’ Reflex Spectrometer coupled with a confocal Leica DM LM microscope (CICT, University of Jaén), equipped with a diode laser (785 nm, 300 mW), and a Peltier-cooled CCD detector, calibrated to the 520.5 cm-1 line of silicon.